Exciting Milestone: Awaiting Fab-Out of the QSolidULV Testchip!
May 08, 2025 −
In mid-January, Racyics taped out the QSolid ULV testchip, featuring innovative testing structures for SRAM timing measurements and standard cell characterizations at ultra-low voltage (ULV) in cryogenic conditions. This includes advanced body-biasing and a cryo-enhanced process mask for evaluating their combined impact on circuit performance.
Our single-rail body-biasing SRAM macro has been adapted for cryogenic ULV applications by adding specific assist techniques for optimized performance under extreme conditions.
This is a big step in lowering supply voltages, that is, reducing power consumption while maintaining circuit performance, overall boosting efficiency.
With expected fab-out in May, we’re excited to see measurement results upcoming soon.
Thank you to all QSolid partners who made this possible!
